a4cb802d54
Improve DUT selection at DeviceHandler: for each DUT it counts how many test instances have been failed on it during the current twister execution, so the next available DUT will be chosen ordering the eligible DUTs by less failures occured so far. The new selection mechanism should increase chances to retry failed tests on different DUTs, for instance to resolve ploblems when some DUTs have connectivity or HW issues slowing down test plan execution, or even block the execution when only one test suite runs whereas the same first DUT candidate in the list is not working and others were not chosen. Signed-off-by: Dmitrii Golovanov <dmitrii.golovanov@intel.com> |
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| .. | ||
| twisterlib | ||
| expr_parser.py | ||
| scl.py | ||